Hprobe Announces New Generation of Magnetic Test Head for Wafer Sort of MRAM in Mass Production
Retrieved on:
Tuesday, November 30, 2021
Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today announced a breakthrough magnetic test head revolutionizing MRAM Wafer Sort (WS).
Key Points:
- Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today announced a breakthrough magnetic test head revolutionizing MRAM Wafer Sort (WS).
- The IBEX-WS test equipment integrates 3D magnetic field capabilities, while increasing field area and uniformity for wafer probing large MRAM arrays.
- We introduced this new test head as a result of close collaboration with MRAM technology and device engineers.
- This newest test head is complementary to the existing test heads available for Wafer Acceptance Test (WAT).